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 2SK3349
Silicon N Channel MOS FET High Speed Switching
ADE-208-804 (Z) 1st.Edition. June 1999 Features
* Low on-resistance R DS = 2.8 typ. (at VGS = 4 V , ID = 25 mA) R DS = 4.8 typ. (at VGS = 2.5 V , I D = 10 mA) * 2.5 V gate drive device * Small package (SMPAK)
Outline
SMPAK
3 1 2 D
G
1. Source 2. Gate 3. Drain
S
2SK3349
Absolute Maximum Ratings (Ta = 25C)
Item Drain to source voltage Gate to source voltage Drain current Drain peak current Body-drain diode reverse drain current Channel dissipation Channel temperature Storage temperature Note: Symbol VDSS VGSS ID I D(pulse) I DR Pch Tch Tstg
Note 2 Note1
Ratings 20 10 50 200 50 100 150 -55 to +150
Unit V V mA mA mA mW C C
1. PW 10 s, duty cycle 1% 2. Value on the alumina ceramic board (12.5x20x0.7 mm)
Electrical Characteristics (Ta = 25C)
Item Drain to source breakdown voltage Gate to source breakdown voltage Gate to source leak current Zero gate voltege drain current Symbol V(BR)DSS V(BR)GSS I GSS I DSS Min 20 10 -- -- 0.8 -- -- 56 -- -- -- -- -- -- -- Typ -- -- -- -- -- 2.8 4.8 85 6 7 1.2 120 450 480 500 Max -- -- 5 1 1.8 3.6 7.2 -- -- -- -- -- -- -- -- Unit V V A A V mS pF pF pF ns ns ns ns Test Conditions I D = 100 A, VGS = 0 I G = 100 A, VDS = 0 VGS = 8 V, VDS = 0 VDS = 20 V, VGS = 0 I D = 10 A, VDS = 5 V
ID = 25 mA,VGS = 4 V Note 3 ID = 10 mA,VGS = 2.5 V Note 3 ID = 25 mA, VDS = 10 V Note 3
Gate to source cutoff voltage VGS(off) Static drain to source on state RDS(on) resistance Forward transfer admittance Input capacitance Output capacitance RDS(on) |yfs| Ciss Coss
VDS = 10 V VGS = 0 f = 1 MHz I D = 25 mA, VGS = 4 V RL = 400
Reverse transfer capacitance Crss Turn-on delay time Rise time Turn-off delay time Fall time Note: 3. Pulse test 4. Marking is DN t d(on) tr t d(off) tf
2
2SK3349
Main Characteristics
Power vs. Temperature Derating 200
*Pch (mW)
5 2 1.0 0.5 0.2 0.1 0.05 0.02 0.01 0.005 0.002 0.001
Maximum Safe Operation Area
150
I D (A)
Channel Dissipation
10 s 100 s 1 ms
DC Op er
Drain Current
100
at
50
Operation in this area is limited by RDS(on)
= 10 ion (1 s ms ho t)
PW
0
50
100
150 Ta ( C)
200
0.0005 0.05 0.1 0.2
0.5 1.0 2
5
10 20
50
Ambient Temperature
Drain to Source Voltage
VDS (V)
*Value on the alumina ceramic boad.(12.5x20x0.7mm)
Value on the alumina ceramic boad.(12.5x20x0.7mm)
Typical Output Characteristics 5V 0.2 4V
I D (A)
Typical Transfer Characteristics 0.2
I D (A)
Pulse Test 3V
0.16
V DS = 10 V Pulse Test 0.16
Drain Current
0.08
Drain Current
0.12
0.12
0.08 25 C 0.04 75 C Tc = -25 C
0.04 VGS = 2V 0 2 4 6 Drain to Source Voltage 8 VDS (V) 10
0
1 2 3 Gate to Source Voltage
4 5 VGS (V)
3
2SK3349
Drain to Source Satueation Voltage vs. Gate to Source Voltage 1.0 Drain to Source Saturation Voltage V DS(on) (V) Pulse Test Static Drain to Source on State Resistance vs. Drain Current 50 Pulse Test 20 2.5 V 10 5 VGS = 4V
0.8
0.6
0.4 10m A 0.2 25m A I D = 50mA 2 4 6 8 VGS (V) 10
Static Drain to Source on State Resistance R DS(on) ( )
2
1.0 0.5 0.01
0
Gate to Source Voltage
0.02 Drain Current
0.05 I D (A)
0.1
Static Drain to Source on State Resistance R DS(on) ( )
Forward Transfer Admittance |yfs| (mS)
10
Static Drain to Source on State Resistance vs. Temperature
Forward Transfer Admittance vs. Drain Current 0.5 0.2 0.1 0.05 75 C V DS = 10 V Pulse Teat Tc = -25 C
8 I D = 25m A 6 VGS = 2.5 V
25 C
10mA
4 10,25,50m A 4V Pulse Test 0 40 80 Tc 120 (C) 160 Case Temperature
0.02 0.01 0.005 0.001
2
0 -40
0.002
0.005
0.1
Drain Current I D (A)
4
2SK3349
Typical Capacitance vs. Drain to Source Voltage
10
Switching Characteristics 10000
Ciss
Capacitance C (pF)
Switching Time t (ns)
Coss
1000
tr tf t d(off)
Crss 1.0
100
t d(on) VGS = 2.5 V, VDD = 10 V PW = 5 s, duty < 1 % 0.02 Drain Current 0.05 I D (A) 0.1
0.1 0
VGS = 0 f = 1 MHz 4 8 12 16 Drain to Source Voltage VDS 20 (V)
10 0.01
Reverse Drain Current vs. Source to Drain Voltage 0.2
Reverse Drain Current I DR (A)
10 V V GS = 0,-5V 5V
0.16
0.12
0.08
0.04 Pulse Test 0 0.4 0.8 1.2 1.6 VSD 2.0 (V) Source to Drain Voltage
5
2SK3349
Switching Time Test Circuit Vin Monitor D.U.T. RL Vin Vin 4V 50 V DD = 10 V Vout 10% 10% 90% td(on) tr 90% td(off) tf 10% Vout Monitor Waveforms
90%
6
2SK3349
Package Dimensions
Unit: mm
0.4
0.3
+ 0.1 - 0.05
0.15 - 0.05
+ 0.1
+ 0.1 - 0.1
+ 0.2 - 0.2
0 ~ 0.1
0.2- 0.05 0.5 1.0 0.5
+ 0.1 - 0.1 + 0.2 .1.6 - 0.2
+ 0.1
0.15
0.7
+ 0.1 - 0.1
0.4
0.1 0.2 + 0.0.5 -
0.8
1.6
Hitachi Code EIAJ JEDEC
SMPAK - -
7
2SK3349
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi's or any third party's patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party's rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi's sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi's sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URL
NorthAmerica : http:semiconductor.hitachi.com/ Europe : http://www.hitachi-eu.com/hel/ecg Asia (Singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm Asia (Taiwan) : http://www.hitachi.com.tw/E/Product/SICD_Frame.htm Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm Japan : http://www.hitachi.co.jp/Sicd/indx.htm For further information write to:
Hitachi Europe GmbH Electronic components Group Dornacher Strae 3 D-85622 Feldkirchen, Munich Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00 Hitachi Europe Ltd. Electronic Components Group. Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 778322 Hitachi Asia Pte. Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533 Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: <886> (2) 2718-3666 Fax: <886> (2) 2718-8180 Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: <852> (2) 735 9218 Fax: <852> (2) 730 0281 Telex: 40815 HITEC HX
Hitachi Semiconductor (America) Inc. 179 East Tasman Drive, San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223
Copyright (c) Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.
8


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